First Demonstration of True 4-bit Memory with Record High Multibit Retention >103s and Read Window >105 by Hydrogen Self-Adaptive-Doping for IGZO DRAM Arrays
2023 International Electron Devices Meeting (IEDM)(2023)
摘要
For the first time, we demonstrate a true 4-bit memory with a large operation margin, as well as record-long multibit retention with the largest read window in IGZO-based 2T0C DRAM. It is enabled by a low-cost oxygen-compensated hydrogen self-adaptive-doping (OHAD) method with a new theory of H self-adaptive-doping. Due to the controllable compensation for defects and enhanced source/drain doping by the OHAD method, the reduced channel carrier scattering and contact resistance are both achieved. The best-in-class devices exhibit the V
TH
modulated to +0.23 V and the I
on
boosted to 35 μA/μm, along with the smallest performance variation of σ(V
TH
) = 25 mV and σ/μ(I
on
) = 4%. It yields a record-high memory window >10
5
and ultra-long retention of 10
4
s with the largest margin, capable of the first 16-level separated current memory states for realizing a true 4-bit 2T0C DRAM cell with record-long 1000-s retention time in multibit operation.
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关键词
True Memory,Reading Window,Chromatography,Performance Variables,Contact Resistance,Memory State,Memory Window,Return On Sales,Treatment Time,Temperature Conditions,Temperature Treatment,O2 Flow,Hydrogen Density
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