基本信息
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个人简介
Bo Hou was born in Shanxi, China, in 1985. He received the M.S. degree in electronic engineering from Southeast University, Nanjing, China, in 2013, where he is currently pursuing the Ph.D. degree at the National ASIC System Engineering Research Center.
He joined the Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, The No. 5 Electronics Research Institute of the Ministry of Industry and Information Technology, Guangzhou, China, in 2013. His research interests include reliability of power devices and integrate circuits’ security.
研究兴趣
论文共 7 篇作者统计合作学者相似作者
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时间
引用量
主题
期刊级别
合作者
合作机构
IET SCIENCE MEASUREMENT & TECHNOLOGY (2024)
IET SCIENCE MEASUREMENT & TECHNOLOGYno. 1 (2024): 25-32
MICROWAVE AND OPTICAL TECHNOLOGY LETTERSno. 1 (2024)
IET SCIENCE MEASUREMENT & TECHNOLOGYno. 3 (2024): 116-122
IEEE Transactions on Microwave Theory and Techniquesno. 3 (2023): 1083-1092
作者统计
#Papers: 7
#Citation: 10
H-Index: 2
G-Index: 3
Sociability: 3
Diversity: 1
Activity: 1
合作学者
合作机构
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