Highly Stacked 8 $\mathbf{Ge}_{\boldsymbol{0.9}}\mathbf{Sn}_{\boldsymbol{0.1}}$ Nanosheet pFETs with Ultrathin Bodies (~3nm) and Thick Bodies (~30nm) Featuring the Respective Record $\mathbf{I}_{\mathbf{ON}}/\mathbf{I}_{\mathbf{OFF}}$ of 1.4x107 and Record $\mathbf{I}_{\mathbf{ON}}$ of $\boldsymbol{92}\boldsymbol{\mu}\mathbf{A}$ at $\mathbf{V}_{\mathbf{ov}}=\mathbf{V}_{\mathbf{DS}}=$ -0.5V by CVD Epitaxy and Dry Etching

2021 IEEE International Electron Devices Meeting (IEDM)(2021)

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