A Synthesis-Analysis Machine With Self-Inspection Mechanism for Automatic Design of On-Chip Inductors Based on Artificial Neural Networks

An automatic inductor design process is helpful to reduce the design cycle of radio frequency (RF) integrated circuit (IC). This paper proposed an efficient synthesis-analysis machine (SAM) for on-chip inductor synthesis and modeling, as well as an automatic dataset generation (ADG) topology for the generation of artificial neural networks (ANNs) training dataset. The SAM consists of a synthesis ANN, two analysis ANNs and a proposed self-inspection machine (SIM). For a given design request, the SAM synthesizes a layout first, followed by analyzing the performance of the layout automatically, and finally improves the layout confidence through self-inspection. Compared to the modeling functions of analysis ANN, the synthesis ANN behaves as an inverse model, of which the inputs are desired inductor performances while the outputs are geometrical parameters of the layout. However, multi-value problems might occur in obtaining geometries of inductors, suggesting with evidence from mathematic relationships between geometrical and electrical parameters of an inductor. A multi-valued training dataset will mislead the synthesis ANN, resulting in unqualified layouts. To deal with this issue, a solution space contraction technique (SSCM) is also proposed. Furthermore, the SIM suspends most of the failures by comparing the output of analysis ANN back to the input of synthesis ANN. An electromagnetic simulation tool is used for experiments, and the effectiveness of the proposed SAM is proven by 6,500 inductor samples.