An Embedded Current Sensing Method for Nanosecond-Pulsewidth and High-Power LIV Testing

Yinong Zeng, Zhihao Liu, Xiaonan Tao,Jian Qiu,Hui Zhao,Kefu Liu, Connie J. Chang-Hasnain

IEEE Transactions on Power Electronics（2025）

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Current sensing,semiconductor laser,pulse laser driver,Light-Current-Voltage (LIV) testing,parasitic inductance

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