Prediction of the Probability of IC Failure and Validation of Stochastic EM-Fields Coupling into PCB Traces Using a Bespoke RF IC Detector

Arunkumar Hunasanahalli Venkateshaiah, John F. Dawson,Martin A. Trefzer, Haiyan Xie, Simon J. Bale, Andrew C. Marvin, Martin P. Robinson

Electronics（2025）

引用 0|浏览0

关键词

electromagnetic interference,integrated circuits,radio frequency IC detector,reverberation chamber,shielding effectiveness,probability of susceptibility,EMC,IC EMC,susceptibility of ICs,probability of IC failure

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要