TCAD Simulation of Radiation Effects on 180 Nm Logic Inverters

Eike Trumann, Amen Allah Bahri, Gia Bao Thieu, Kirsten Weide-Zaage, Dorian Von Wolff, Andre Bausen, Alexander Müller,Guillermo Payá-Vayá

2025 26th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)（2025）

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Key words

TCAD,radiation effects,displacement damage,single event effects

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