Dynamic IR-Drop Prediction Through a Multi-Task U-Net with Package Effect Consideration

Yu-Hsuan Chen, Yu-Chen Cheng, Yong-Fong Chang, Yu-Che Lee, Jia-Wei Lin, Hsun-Wei Pao, Peng-Wen Chen,Po-Yu Chen,Hao-Yun Chen, Yung-Chih Chen,Chun-Yao Wang,Shih-Chieh Chang

Design, Automation, and Test in Europe（2025）

Cited 0|Views0

Key words

Voltage Drop,Dynamic Prediction,Root Mean Square Error,Model Performance,Feature Maps,Machine Learning Approaches,Input Features,Memory Cells,Simulated Patterns,U-Net Architecture,Commercial Tools,Increase In Prediction Accuracy,Fast Prediction,ML-based Approaches,Comprehensive Learning,Prediction Model,Mean Square Error,Power Analysis,Convolutional Neural Network,Local Information,Convolutional Layers,Power Distribution Network,Peak Current,Skip Connections,Multi-task Model,Prediction Error,Multi-task Learning,Tree-based Methods,Types Of Maps,Current Flow

AI Read Science

Must-Reading Tree

Example

Generate MRT to find the research sequence of this paper

Chat Paper

Summary is being generated by the instructions you defined