Nanoscale Capacitance Spectroscopy Based on Multifrequency Electrostatic Force Microscopy.
Beilstein journal of nanotechnology（2025）
关键词
atomic force microscopy,capacitance gradients,dielectric constant,dielectric spectroscopy,heterodyne frequency mixing,kelvin probe force microscopy,multifrequency afm,quantitative force spectroscopy,scanning capacitance force microscopy
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