Device Characterization and Threshold Voltage Extraction of Multi-VT Transistors in UMC 65nm Technology: A Methodological Approach
2024 IEEE 11th Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON)（2024）
Key words
Device Characterization,Threshold Extraction,RVT (Regular-VT),LVT (LOW-VT),HVT (High-VT)
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