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Crystallographic Engineering of CrN Buffer Layers for GaN Thin Film Epitaxy

Kyu-Yeon Shim, Seongho Kang, Min-Joo Ahn, Yukyeong Cha, Eojin-Gyere Ham, Dohoon Kim,Dongjin Byun

Materials (Basel, Switzerland)(2025)

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Key words
gallium nitride (GaN),chrome nitride (CrN),metal organic chemical vapor deposition (MOCVD),buffer layer,epitaxial growth
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