Unraveling the Dynamics of Conductive Filaments in MoS_2 Based Memristors by Operando Transmission Electron Microscopy

Ke Ran, Janghyun Jo, Sofía Cruces,Zhenxing Wang, Rafal E. Dunin-Borkowski,Joachim Mayer, Max C. Lemme

arxiv（2025）

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