Sample Processing and Benchmarking for Multibeam Optical Scanning Transmission Electron Microscopy.

B H Peter Duinkerken, Arent J Kievits,Anouk H G Wolters, Daan van Beijeren Bergen En Henegouwen,Jeroen Kuipers,Jacob P Hoogenboom, Ben N G Giepmans

Microscopy and microanalysis the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada（2025）

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