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Improving On-Wafer Characterization of Sub-THz Devices: A Probe Influence and Crosstalk Study

Jerome Cheron, Nicholas C. Miller,Antonio Crespo,Dylan F. Williams, Rob D. Jones, Michael Elliott,Jeffrey A. Jargon, Ryan Gilbert,Benjamin F. Jamroz, Jason Shell,Bryan T. Bosworth, Edward Gebara,Nicholas R. Jungwirth,Peter H. Aaen,Christian J. Long, Nathan D. Orloff,James C. Booth, Ari D. Feldman

IEEE Transactions on Microwave Theory and Techniques（2025）

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Key words
Crosstalk correction,microwave probes,on-wafer calibration,sub-THz frequencies,transistor characterization
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