Ampere-class Double Pulse Testing of Half-Inch H-terminated Diamond MOSFET Chip

Keita Takaesu, Daisuke Sano, Iku Ota, Keiko Otsuka,Daisuke Takeuchi,Toshiharu Makino,Hitoshi Umezawa

Applied Physics Express（2025）

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Key words

diamond,power device,double pulse testing,MOSFET

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