8.1 Dynamic Guard-Band Features of the IBM Znext System

Tobias Webel,Phillip J. Restle,Ramon Bertran,Alper Buyuktosunoglu,Sean M. Carey, Alejandro Cook, Karl Anderson,Michael Romain,Thomas Strach, Pradeep Bhadravati Parashurama, Aishwarya Tadkase, Rahman Abber Tahir, Luke Jenkins, Kevin Low, Eberhard Engler

IEEE International Solid-State Circuits Conference（2025）

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Key words

Guard Band,Maximum And Minimum,Energy Conservation,Fault-tolerant,Performance Loss,Square Wave,Control Loop,Recovery Effect,Operative Field,Improve Energy Efficiency,Use Of Thresholds,Point Load,Critical Path,Voltage Sag,Wave Power,Changes In Workload,Voltage Control Loop,Recovery Error,Robust Recovery,Processor Chip

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