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Detection Model for Automatic Defect Quantification and Segmentation for Stepped Eddy Current Thermography

Yuan Gao,Liang Zhang,Zheng Liang,Ting Zheng,Xiong Deng, Xin Chen

IEEE Sensors Journal（2025）

Cited 0|Views3
Key words
Non-destructive testing,Defect quantification study,Stepped eddy current thermography,Defect segmentation,Skewness model
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