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Next Generation of ICeGaNⓇ for Superior No Load and Light Load Performance

Kalparupa Mukherjee, Jin Zhang, Kaspars Ledins, Carlos Toyos Bada,Nirmana Perera,Loizos Efthymiou, Sheung Wai Fung,Martin Arnold,Giorgia Longobardi,Florin Udrea

Power Electronic Devices and Components(2025)

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Key words
GaN,GaN HEMT,No-load,Consumer applications,Reliability,Robustness
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