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Forward-Forward Learning Exploiting Low-Voltage Reset of RRAM

B. Imbert,A. Renaudineau, M. H. Diallo,J.-D. Aguirre-Morales, M. A. Iftakher,K.-E. Harabi,C. Turck,M. Drouhin,T. Hirtzlin,E. Vianello,J.-M. Portal,M. Bocquet,D. Querlioz

2024 IEEE International Electron Devices Meeting (IEDM)（2024）

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关键词
Energy Efficiency,Energy Devices,Retention Efficiency,Energy Conservation,Load Data,Backpropagation
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