Ab-Initio Screening of Amorphous Chalcogenides for Selector-Only Memory (SOM) Through Electrical Properties and Device Reliability
2024 IEEE International Electron Devices Meeting (IEDM)（2024）
Key words
Device Reliability,Electric Reliability,Amorphous Chalcogenide,Amorphous Solid,Screening Criteria,Trade-off Relationship,Memory Window,Thermal Stability,Structural Stability,Band Gap,Density Functional Theory,Activation Energy,Glass Transition Temperature,Number Of Bonds,Amorphous Structure,Depletion Region,Memory Characteristics,Cohesive Energy,Read Operation,Charged Defects
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