Quantum-Confined-Traps-Assisted Carrier-Multiplication-Enabled Photodetector and Arrays for Smart Visualization and High-Quality Imaging
2024 IEEE International Electron Devices Meeting (IEDM)（2024）
Key words
Visual Images,High-quality Images,Specific Detection,Current Ratio,Ultrathin Layer,Gallium Nitride,Optoelectronic System,Oxynitride,Illumination,Imaging System,Device Applications,Photocurrent,I-V Curves,Bias Voltage,Printed Circuit Board,Impact Ionization,Kelvin Probe Force Microscopy
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