Contrastive Prototype Loss Based Discriminative Feature Network for Few-Shot Learning

Leilei Yan,Feihong He,Xiaohan Zheng,Li Zhang, Yiqi Zhang, Jiangzhen He, Weidong Du, Yansong Wang,Fanzhang Li

Applied Intelligence（2025）

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Metric-based few-shot learning,Contrastive prototype loss,Feature distribution,Discriminative feature,Prototype

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