谷歌浏览器插件
订阅小程序
在清言上使用

A Simulation Study on Cell Scaling Impacts in 3D Charge-Trapping (CT) Flash Memory

Wanyu Li, Haitao Dong,Qianwen Wang, Yang Feng,Xuepeng Zhan,Jixuan Wu,Jiezhi Chen

2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)(2024)

引用 0|浏览2
关键词
Flash memory,Charge trapping,Reliability
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要