A Technique for Optimal On-Wafer Device Spacing at Millimeter-Wave Frequencies

Rob D. Jones,Jerome Cheron,Joseph E. Diener,Peter H. Aaen,Richard A. Chamberlin,Benjamin F. Jamroz,Dylan F. Williams,Ari D. Feldman,Atef Z. Elsherbeni

IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS（2025）

Cited 0|Views1

Key words

Gallium nitride (GaN),high-electron-mobility transistor (HEMT),microstrip,monolithic microwave integrated circuit (MMIC),silicon carbide (SiC),vector network analyzer (VNA),Gallium nitride (GaN),high-electron-mobility transistor (HEMT),microstrip,monolithic microwave integrated circuit (MMIC),silicon carbide (SiC),vector network analyzer (VNA)

AI Read Science

Must-Reading Tree

Example

Generate MRT to find the research sequence of this paper

Chat Paper

Summary is being generated by the instructions you defined