Reliability Analysis of Baremetal and FreeRTOS Applications on Microchip PolarFire SoC RISC-V Multiprocessors Using High-Energy Protons
IEEE ACCESS（2025）
关键词
Reliability,Benchmark testing,Protons,Radiation effects,Instruments,Transceivers,Monitoring,Synchronization,Software,Microprocessors,RISC-V,radiation testing,reliability,single-event effects,space applications,system-on-chip,total ionizing dose
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