Impact of Tetrakis(ethylmethylamino)-based Precursor and Oxygen Source Selection on Atomic Layer Deposition of Ferroelectric HfxZr1-xO2 Thin Films
APPLIED SURFACE SCIENCE(2025)
Key words
Hafnium Zirconium Oxide,Atomic layer deposition,Cocktail precursor,Hydrogen peroxide,Ferroelectric
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