Bayes Estimation of Defective Proportion for Single Shot Device Testing Data with Information on Masking and Manufacturing Defects
PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART O-JOURNAL OF RISK AND RELIABILITY（2024）
关键词
Bayes estimation,Bayes prediction,single-shot-device testing data,masked data,defective proportion,metropolis-Hastings algorithm,Monte Carlo simulations
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