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Field Verification of Fault Localization with Integrated Physical-Parameter-Aware Methodology

Hideki Nishizawa,Giacomo Borraccini,Takeo Sasai,Yue-Kai Huang,Toru Mano,Kazuya Anazawa, Masatoshi Namiki, Soichiroh Usui, Tatsuya Matsumura,Yoshiaki Sone,Zehao Wang,Seiji Okamoto,Takeru Inoue,Ezra Ip,Andrea D’Amico,Tingjun Chen,Vittorio Curri,Ting Wang,Koji Asahi,Tomoaki Yoshida,Koichi Takasugi

2024 IEEE Photonics Conference (IPC)（2024）

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Key words
Optical network automation,data center interconnect,field verification,fault detection and localization
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