Improved Leakage and Fatigue Properties of W/Hf0.5Zr0.5O2/W Capacitor Through the Insertion of Pt Metallic Layer
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING(2025)
关键词
Hf 0.5 Zr 0.5 O 2 thin film,Pt metallic layer,Ferroelectric properties,Leakage current,Dielectric characteristic,Endurance property
AI 理解论文
溯源树
样例

生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要