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Accessing Electronic Properties of Two-Dimensional Materials with Gate-Dependent Micro Four-Point Probe

Marco Introna,Janusz Bogdanowicz,Henry Medina Silva,Sreetama Banerjee, Kristoffer G. Kalhauge,Lennaert Wouters,Yuanyuan Shi, Ju-Seok Kim,Dennis Lin,Inge Asselberghs,Christoph Adelmann,Valeri V. Afanas'Ev,Harold J. W. Zandvliet,Umberto Celano

2D MATERIALS（2025）

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关键词
2D materials metrology,micro-four-point probe,backgated M4PP,gate-dependent M4PP
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