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Revealing the Reliability Performance of a Dielectric Modulated Negative Capacitance Junctionless FinFET Biosensor

Navneet Gandhi,Sunil Rathore,Rajeewa Kumar Jaisawal,P. N. Kondekar,Ankit Dixit,Naveen Kumar,Vihar Georgiev,Navjeet Bagga

IEEE Transactions on Dielectrics and Electrical Insulation（2024）

Cited 2|Views1
Key words
Dielectric Modulated,Negative Capacitance,Reliability,Metal gate granularities,Line edge roughness
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