Chrome Extension
WeChat Mini Program
Use on ChatGLM

Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs

Joao Oliveira,Jean-Michel Reynes,Herve Morel, Pascal Frey, Olivier Perrotin, Laurence Allirand,Stephane Azzopardi, Michel Piton,Fabio Coccetti

ENERGIES(2024)

Cited 0|Views6
Key words
SiC MOSFET,short circuit,test methodology,failure analysis
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined