Reliability of Tunneling Regime for Silicon on Insulator-Based Neuron

Shubham Patil,Abhishek Kadam,Rashmi Saikia, Jay Sonawane,Karansingh Thakor,Ajay Kumar Singh, R. Gaurav,Nihar Ranjan Mohapatra,Sandip Lashkare,Veeresh Deshpande,Udayan Ganguly

IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）

引用 0|浏览0

关键词

Degradation,Neurons,Stress,MOSFET,Silicon-on-insulator,Logic gates,Temperature measurement,Semiconductor device measurement,Current measurement,Thermal stresses,Band-to-band-tunneling (BTBT),on regime (I-ON),reliability,silicon on insulator (SOI),spiking neural network (SNN),subthreshold (SS) regime

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要