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Cross-Scale Reliability Simulation of Chiplet Devices Based on Sub-Modeling Approach

Taohan Wang, Hanwen Feng, Jiaqi Li,Shang Wang, Gehui Sun,Pengrong Lin,Shimeng Xu,Yanhong Tian

2024 25TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT(2024)

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Key words
Submodeling,FEA,Chiplet,Reliability
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