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Development and Application of Reference and Routine Analytical Methods Providing SI-traceable Results for the Determination of Technology-Critical Elements in PCB from WEEE

Giancarlo D'Agostino,Marcus Oelze,Jochen Vogl,Jean-Philippe Ghestem, Nicolas Lafaurie,Ole Klein,Daniel Proefrock,Marco Di Luzio,Luigi Bergamaschi,Radojko Jacimovic,Caroline Oster,Johanna Irrgeher,Shaun T. Lancaster, Anna Walch,Anita Roethke,Lena Michaliszyn,Axel Pramann,Olaf Rienitz,Timo Sara-Aho,Oktay Cankur, Derya Kutan,Johanna Noireaux

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY（2024）

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