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MSIDetector: Detecting Multi-Scenario Industrial Defects Using an Adapted Visual Foundation Model and Dual Thresholding Discriminator

Xujie He,Jing Jin, Fujiang Yu, She Zhao, Duo Chen, Xiang Gao

MEASUREMENT(2025)

Cited 0|Views8
Key words
Defect detection,Open-set detector,Foundation model,Industrial feature adapter,Dual thresholding
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