Research on Gate Charge Degradation of Multi-Chip IGBT Modules in Power Supply for Unmanned Aerial Vehicles Yuheng Li,Zhiquan Zhou,Jinlong Wang, Lina Wang,Chenxu WangELECTRONICS(2024)引用 0|浏览6关键词IGBT,UAV,reliability,prognostic,gate chargeAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要