Refined Analysis of the Correlated Carrier Number and Mobility Fluctuations Mechanism in MOSFETs
IEEE Transactions on Electron Devices（2024）
关键词
Noise,Fluctuations,Scattering,Resistance,MOSFET,Logic gates,Voltage fluctuations,Correlated carrier number and mobility fluctuations (CNF/CMF),low-frequency noise,Y-function
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