Detection of Very Fast Interface Traps at 4H-Sic/aln and 4H-Sic/al2o3 InterfacesArnar M. Vidarsson,Axel R. Persson, J. Tai Chen,Daniel Haasmann,Jawad Ul-Hassan,Sima Dimitrijev,Niklas Rorsman,Vanya Darakchieva,E.Ö. SveinbjörnssonSolid State Phenomena（2024）引用 0|浏览3AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
