State-Independent Low Resistance Drift SiSbTe Phase Change Memory for Analog In-Memory Computing Applications

H. Y. Cheng, Z. L. Liu, A. Majumdar, Alexander Grun,A. Ray, J. Su,Malte J. Rasch,Fabio Carta,Lynne M. Gignac,C. Lavoie,C. W. Cheng, M. Bright Sky,H. L. Lung

Symposium on VLSI Technology（2024）

Cited 1|Views3

Key words

Computational Memory,Resistance Drift,Data Retention,Hardware Accelerators,Deep Neural Network,Levels Of Resistance,Inference Accuracy,Drift Coefficient

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