Sensing High-Density IC Substrates: Adaptive Fractional Differentiation for Accurate Image Segmentation
IEEE SENSORS JOURNAL（2024）
Key words
Image segmentation,Substrates,Sensors,Integrated circuit modeling,Integrated circuits,Inspection,Etching,Active contour model (ACM),fractional-order differentiation,high-density integrated circuit (IC) substrate,image segmentation,metallographic image
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