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Insertion Loss and Polarization-Dependent Loss Measurement Improvement to Enable Parallel Silicon Photonics Wafer-Level Testing

Daehong Kim,Jeroen De Coster,Joris Van Campenhout,Yoojin Ban,Dimitrios Velenis,Huseyin Sar,Hakim Kobbi,Rafal Magdziak,Younghyun Kim

OPTICS AND LASERS IN ENGINEERING（2025）

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Key words
Si photonics,Parallel test,IL,PDL,SOP,Wafer testing
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