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Optimizing Photocurrent Intensity in Layered SiGe Heterostructures

M. T. Sultan,M. L. Ciurea,I Stavarache,K. A. Thorarinsdottir,U. B. Arnalds,V Teodorescu,A. Manolescu,S. Ingvarsson,H. G. Svavarsson

Semiconductor Science and Technology（2024）

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Key words
SiGe,nanoparticles,x-ray diffraction,transmission electron microscopy,Raman spectroscopy,photocurrent,strain
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