In-Depth Understanding of Nitridation-Induced Endurance Enhancement in FeFETs: Defect Properties and Dynamics Characterized by Nonradiative Multi-Phonon Model
IEEE Transactions on Electron Devices（2024）
Key words
FeFETs,Degradation,Energy states,Statistics,Sociology,Stress,Fabrication,Defect,endurance,ferroelectric field-effect transistors (FeFETs),nitridation,nonradiative multi-phonon (NMP) model
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined