Evaluation of Optical Interferometry for Thickness Uniformity Control of Parylene HT Coating on Titanium Substrates
2024 SYMPOSIUM ON DESIGN, TEST, INTEGRATION AND PACKAGING OF MEMS/MOEMS, DTIP 2024(2024)
关键词
Parylene HT,Thickness,White-Light Scanning Interferometry,non-destructive measurements,Etching
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