Experimental Demonstration of Field-Free STT-Assisted SOT-MRAM (SAS-MRAM) with Four Bits Per SOT Programming Line
IEEE ELECTRON DEVICE LETTERS(2024)
Key words
Magnetoresistive random access memory,MRAM,spin-transfer torque,STT,spin-orbit torque,SOT,STT-assisted SOT,SAS,SAS-MRAM,field-free switching
AI Read Science
Must-Reading Tree
Example

Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined