Quantifying Defect-Mediated Electron Capture and Emission in Flexible Monolayer WS2 Field-Effect Transistors
Device Research Conference（2024）
Key words
Electronic Capture,Dynamic Process,Trapping,Previous Efforts,Semiconductor Devices,Gate Dielectric,Time-dependent Measurements,Chemical Vapor Deposition,Conduction Band,Electron Beam Evaporation,Atomic Layer Deposition,Polyethylene Naphthalate,Forward Sweep,Subthreshold Slope
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