A Vectorial Current Density Visual Inspection Method for IGBT Modules

Yangjing Wu, Hangcheng Li, Yichen He, Jing Li, Huiyi Su, Chengyu Shi,Wenwei Zhang,Mingji Zhang

IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）

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关键词

Insulated gate bipolar transistors,Current density,Magnetic fields,Circuit faults,Magnetic field measurement,Inspection,Magnetic resonance imaging,Circuit health prognostics,current density imaging,insulated gate bipolar transistor (IGBT) modules,nondestructive testing

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