Dynamic Detection and Mitigation of Read-disturb for Accurate Memristor-based Neural Networks
2024 IEEE 6TH INTERNATIONAL CONFERENCE ON AI CIRCUITS AND SYSTEMS, AICAS 2024（2024）
Key words
Neural Network,Resistance Change,Unit Energy,Undesirable Changes,Conventional Architecture,Read Operation,Unintended Changes,Low Voltage,Resistant Varieties,Batch Normalization,Analog-to-digital Converter,Random Access Memory,Accuracy Of Network,Least Significant Bit,Resistive Random Access Memory,Implementation Of Neural Networks,Accuracy Of Neural Network,Read Voltage,Digital Weight,Neural Network Inference,Memory Wall
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