Polarization-sensitive and Wide-Spectrum Photodetector from Ultraviolet to Near-Infrared Light Based on 2D Tellurium at Room Temperature

Two-dimensional (2D) materials have emerged as promising candidates for photodetection applications, due to their unique structural and optical properties. Herein, we conducted a comprehensive investigation of the 2D Te-based photodetector. The crystal structure, angle-resolved polarized Raman (ARPR) spectroscopy, and theoretical analysis demonstrate the in-plane lattice anisotropy of Te, underlining its suitability for polarization-dependent photodetection. Photocurrent measurements over a broad spectral range (from 365 to 1310 nm) reveal excellent photoresponse characteristics, with responsivity (Rλ) and detectivity (D*) values reaching up to 1189 A/W and 11.51 × 108 Jones, respectively, under 1064 nm illumination. Furthermore, the Te-based photodetector exhibits superior stability, retaining approximately 90 % of its initial performance after six months of ambient exposure. Polarization-sensitive photodetection experiments show significant dichroism ratios (up to 4.6 for 1064 nm illumination), emphasizing the potential of 2D Te for advanced polarization applications. The combination of the broad spectral response, high anisotropy ratio, and long-term stability positions 2D Te as a promising candidate for future photodetection technologies.